Far Field Beam Distribution Analysis
Radiometric Intensity Distribution (Opto-electrical property)
| ◐ Spectral Coverage: 250 ~ 1000nm ◐ 3 axis Type C Type goniometer ◐ Sample size : upto 80mm ◐ Comply with CIE condition A and B ◐ Built-in Auto sequence measurement |
Goni Series are designed to measure far-field beam distribution of LED and VCSEL with various driving condition
complying with CIE 127 condition A and B along with eye safety consideration.
Beam distribution can be used for Quality Control and to check correlation of product and simulation utilizing rayset from chip, reflectance and transmittance property of molding material and reflector.
Goni-300S has fixed sample jig mounted on a rotation stage with horizontal geometry and its base stage rotates
along the polar axis to measure 3 dimensional beam distribution. Vertical geometry version is also available for easy
mounting of Vcsel Module with temprature dependency characterization.
▣ Operation Program
▣ Sample Mounting Jig
Images below show examples of 5 pin-side view LED mounting jig for luminous intensity and view angle measurement.
They are designed for easy and quick loading to reduce tact time. Vertical geometry system doesn't require special mouting
jig unless temperature dependency test is needed.
5050 5pin RGB LED
